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Luminescence measuring instrument - List of Manufacturers, Suppliers, Companies and Products

Luminescence measuring instrument Product List

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Thermoluminescence measurement device TL-2000

Thermoluminescence measurement device TL-2000

The TL-2000 is the latest thermoluminescence measurement device developed primarily for the detection of irradiated food.

The notification No. 0529004 from the Food Safety Agency introduces the TL-2000 thermoluminescence measurement device manufactured by Nanogray. The TL-2000 complies with the TL method standards, which are considered the standard analysis method for irradiated spices. The TL-2000 was developed with the themes of being domestically produced, cost-effective, and high-performance, primarily for the detection of irradiated food. Additionally, it can also be used for thermoluminescence and chemiluminescence measurements, such as dating and TL material analysis.

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[Analysis Case] Photoluminescence Mapping Measurement of SiC Diodes

[Analysis Case] Photoluminescence Mapping Measurement of SiC Diodes

Detection cases of stacking faults in SiC.

SiC has been actively researched and utilized in recent years for applications such as power devices. Due to the various polytypes of SiC, there is a problem where stacking defects, which can lead to disordered stacking arrangements, easily occur. One method for detecting these defects is photoluminescence (PL), which analyzes the light emitted when a sample is stimulated with light. We will introduce a case where mapping measurements were conducted to detect light emission caused by defects.

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Photoluminescence method

Photoluminescence method

PL：PhotoLuminescence

The photoluminescence method is a technique that involves irradiating a substance with light and observing the light emitted when excited electrons return to their ground state. Various information can be obtained from the resulting emission spectrum. - Samples with a bandgap of about 3.5 eV can be excited. - The mapping function allows for the acquisition of extensive information. - Measurements can be conducted down to approximately 10 K. - Generally, it is a non-destructive measurement that does not require special pretreatment.

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Precautions for Low-Temperature Photoluminescence Measurement

Precautions for Low-Temperature Photoluminescence Measurement

Photoluminescence method

- Photoluminescence measurement (PL measurement) can be conducted not only at room temperature but also by placing the sample in a cryostat for low-temperature measurements. Low-temperature measurements tend to show an increase in peak intensity and a decrease in peak full width at half maximum compared to room temperature measurements, which may provide insights into various energy levels. - Below, we will explain the precautions for low-temperature measurements and the differences in spectral shapes between room temperature and low-temperature measurements.

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[Analysis Case] Low-Temperature PL Spectrum of Si After Ion Implantation Annealing Treatment

[Analysis Case] Low-Temperature PL Spectrum of Si After Ion Implantation Annealing Treatment

It is possible to confirm the recovery of crystallinity due to irradiation defects and annealing.

In the fabrication of Si-based semiconductor devices, various processes such as ion implantation and annealing are performed. It is considered important to confirm the degree of irradiation defects and the extent of crystallinity recovery before and after these processes in order to control the manufacturing process. Photoluminescence (PL) measurements at low temperatures are one effective means of investigating these aspects. An example of PL measurements of samples that underwent ion implantation on a Si substrate followed by annealing treatment is presented.

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YWafer Mapper GS4

YWafer Mapper GS4

Photoluminescence and film thickness mapping measurement equipment for 2, 3, and 4-inch wafers for LED/LD production Wafer PL

Y Systems was established based on its achievements in measurement and evaluation technologies in research environments for blue laser diodes (LD) and light-emitting diodes (LED). In 2001, we commercialized the first unit of our current flagship product, the Y-Wafer Mapper, with our staff. We will continue to play a part in the cutting-edge technology of solid-state lighting.

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